Abstract

Electromagnetic analysis (EMA) is influenced by the quality of the measurement of electromagnetic (EM) waves. The EM waves used in EMA are compromising emanations emitted unintentionally from the target device via paths not intended by the designer. Therefore, to measure these EM waves precisely, it is important to understand the mechanisms behind their unintended radiation.
This talk will discuss the mechanisms of unintentional EM emissions from devices from the perspective of electromagnetic compatibility, explaining how EM waves should be measured based on these mechanisms.
Some devices emit weak EM waves, potentially making them resistant to EM-based attacks. In such cases, passive EM wave measurement may not provide the necessary information for analysis. For devices resistant to passive measurement, we will introduce a method of actively irradiating EM waves to induce compromising emanations that contain internal information, which can then be measured to extract target data.

About the Speaker

Yuichi Hayashi (IEEE Senior Member) received the M.S. and Ph.D. degrees in information sciences from Tohoku University, Sendai, Japan, in 2005 and 2009, respectively.  He is currently a Professor with the Graduate School of Information Science, Nara Institute of Science and Technology, Nara, Japan. His research interests include electromagnetic compatibility and information security. Dr. Hayashi was the recipient of many awards and honors, including the IEEE Electromagnetic Compatibility Society Technical Achievement Award, IEEE International Symposium on EMC Best Symposium Paper Award, and Workshop on Cryptographic Hardware and Embedded Systems Best Paper Award. He is the Chair of Electromagnetic Information Leakage Subcommittee in IEEE EMC Technical Committee 5.